{"id":64,"date":"2022-06-27T12:06:43","date_gmt":"2022-06-27T10:06:43","guid":{"rendered":"https:\/\/web.umons.ac.be\/geol\/?page_id=64"},"modified":"2022-06-27T13:55:45","modified_gmt":"2022-06-27T11:55:45","slug":"equipments","status":"publish","type":"page","link":"https:\/\/web.umons.ac.be\/geol\/en\/equipments\/","title":{"rendered":"Equipments"},"content":{"rendered":"<h2>Mineralogical and petrographic preparation and analysis equipment<\/h2>\n<p><strong>Preparation of thin polished slides<\/strong><\/p>\n<ul>\n<li>BROT flattening, lathing, gluing and polishing machine<\/li>\n<\/ul>\n<p><strong>Preparation of oriented aggregates<\/strong><\/p>\n<ul>\n<li>Various equipment for the specific preparation of clay minerals for X-ray diffraction analysis<\/li>\n<\/ul>\n<p><strong>Metallization for SEM or EPMA analysis<\/strong><\/p>\n<ul>\n<li>EDWARDS evaporative plating machine<\/li>\n<\/ul>\n<p><strong>X-ray diffraction<br \/>\n<\/strong><\/p>\n<ul>\n<li>Diffractometer BRUKER-SIEMENS D5000 with automatic 40-sample changer<\/li>\n<\/ul>\n<p><strong>Optical microscopy<\/strong><\/p>\n<ul>\n<li>LEICA DMLP polarizing microscope equipped with transmission, reflection, fluorescence and phase contrast<\/li>\n<li>LEICA DM750p microscope equipped for transmission and reflection<\/li>\n<li>LEICA Ortholux microscope equipped with reflectometry<\/li>\n<\/ul>\n<p><strong>Cathodoluminescence<\/strong><\/p>\n<ul>\n<li>ZEISS Universal-R microscope adapted for cathodoluminescence with a CITL Mk5 cold cathode unit<\/li>\n<li>CITL COS 8200 optical spectrometer (300-1100 nm)<\/li>\n<li>Optical spectral imaging device<\/li>\n<\/ul>\n<p><strong>Electronic microanalysis<\/strong><\/p>\n<ul>\n<li>CAMECA SX50 electron microprobe equipped with 4 WDS spectrometers (Wavelength-Dispersive Spectroscopy)<\/li>\n<li>Integrated optical microscopy and SE, BSE and CL sensors<\/li>\n<\/ul>\n<p><strong>Electron microscopy<\/strong><\/p>\n<ul>\n<li>CAMBRIDGE Stereoscan S240 scanning electron microscope equipped with an EDS (Energy-Dispersive Spectroscopy) spectrometer<\/li>\n<\/ul>\n<h2>Geophysical equipment<\/h2>\n<p><strong>Geological radar<\/strong><\/p>\n<ul>\n<li>Ramac X3M (Mal\u00e4 Geosciences)<\/li>\n<li>250 and 500 Mhz antennas<\/li>\n<\/ul>\n<p><strong>Seismic prospecting<\/strong><\/p>\n<ul>\n<li>Seismograph OYO Mc Seis 170f<\/li>\n<li>Summit Compact Unit Seismograph (DMT)<\/li>\n<li>48 4.5 Hz geophones<\/li>\n<li>48 100 Hz geophones<\/li>\n<li>Vibsist vibrating source<\/li>\n<\/ul>\n<p><strong>Electromagnetic prospecting<\/strong><\/p>\n<ul>\n<li>VLF (EM16)<\/li>\n<li>Slingram (ABEM)<\/li>\n<\/ul>\n<p><strong>Electrical prospecting<\/strong><\/p>\n<ul>\n<li>Syscal Pro 192 channels (Iris Instruments)<\/li>\n<li>Syscal R1 (Iris Instruments)<\/li>\n<li>Switch 96 channels (Iris Instruments)<\/li>\n<\/ul>\n<h2>Hydrogeological equipment<\/h2>\n<p><strong>Laboratory and field measurements<\/strong><\/p>\n<ul>\n<li>Xenon lamp spectrofluorometer &#8211; Thermo Electron Varioskan<\/li>\n<li>Multi-parameter probes (pH, conductivity, dissolved O2, redox potential)<\/li>\n<li>Pressure and temperature sensors (type DIVER)<\/li>\n<li>Drilling micro-spigot for measuring water flows<\/li>\n<li>Current meter for measuring surface water flows<\/li>\n<li>50 m piezometer probe<\/li>\n<li>100 m piezometer probe<\/li>\n<\/ul>\n<p><strong>Pumping<\/strong><\/p>\n<ul>\n<li>Submersible pump MP1 (diameter: 2 inches)<\/li>\n<\/ul>\n<p><strong>Sampling<\/strong><\/p>\n<ul>\n<li>Two Isco 6712 automatic samplers<\/li>\n<\/ul>\n<h2>Miscellaneous equipment<\/h2>\n<p><strong>Topographic measurements<\/strong><\/p>\n<ul>\n<li>Ashtech differential GPS<\/li>\n<li>Disto laser for measuring angles and distances<\/li>\n<\/ul>\n","protected":false},"excerpt":{"rendered":"<p>Mineralogical and petrographic preparation and analysis equipment Preparation of thin polished slides BROT flattening, lathing, gluing and polishing machine Preparation of oriented aggregates Various equipment for the specific preparation of clay minerals for X-ray diffraction analysis Metallization for SEM or EPMA analysis EDWARDS evaporative plating machine X-ray diffraction Diffractometer BRUKER-SIEMENS D5000 with automatic 40-sample changer [&hellip;]<\/p>\n","protected":false},"author":191,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-64","page","type-page","status-publish","hentry"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v25.1 - 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